The EPPL is divided into two parts: – Part I components have sufficient data to permit their use without any special provision, on condition that they meet the application requirements. – Part II components have minimum evaluation data demonstrating capability to satisfy Space-application requirements, but additional testing effort may be necessary to satisfy specific programme…
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This document contains a list of components that have been qualified to the rules of the ESCC System and are intended for use in ESA and other spacecraft and associated equipment in accordance with the requirements of the ECSS Standard ESCC-Q-ST-60. Last version link on ESCIES
U.S. Defense Military Specifications and Standards as “MIL-STD” and “MIL-PRF” are used to achieve standardization requirements for Quality, Reliability and Cost of Ownership compatibility on stringent applications. Related documents, such as defense handbooks and defense specifications, are herein addressed. SPECIFICATION DESCRIPTION MIL-STD-202 Test Method Standard, Electronic and Electrical Components This standard establishes uniform methods for…
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List of Standard Microcircuit Drawings The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, “Parts Management.” The PMP will be the avenue for screening candidate parts for the SMDP by the DLA Land and Maritime Military Parts Control Advisory Group…
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Hybrid Microcircuits, General Specification for This specification establishes the general performance requirements for Hybrid Microcircuits, Multi-Chip Modules (MCM) for ensuring that these devices meet the applicable performance requirements. Verification is accomplished through the use of one of two quality programs (Appendix A). The main body of this specification describes the performance requirements and the requirements…
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Semiconductor Devices, General Specification for This specification establishes the general performance requirements for Semiconductor devices. Detail requirements and characteristics are specified in the specification sheet. Five quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance (RHA) levels are provided for…
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Test Method Standard, Microcircuits This standard establishes uniform methods, controls, and procedures for Testing Microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures necessary to…
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Test Method Standard Test Methods for Semiconductor Devices This standard establishes uniform methods for Testing Semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term “devices” includes such items as transistors, diodes,…
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