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Tag: Components

ESCIES – European Space Components Information Exchange System

The European Space Components Information Exchange System (ESCIES) establish an information exchange system on component data with access available to all European users. ESCIES aims to systematically collect and make available this data to the European space component community. Large companies have built up databases through their role as a prime contractor. However, medium and…
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MIL Standards & Performance Specification system

U.S. Defense Military Specifications and Standards as “MIL-STD” and “MIL-PRF” are used to achieve standardization requirements for Quality, Reliability and Cost of Ownership compatibility on stringent applications. Related documents, such as defense handbooks and defense specifications, are herein addressed. SPECIFICATION DESCRIPTION MIL-STD-202 Test Method Standard, Electronic and Electrical Components This standard establishes uniform methods for…
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Avalanche Technology – The Next-Generation MRAM Company

Avalanche Technology, headquartered in Fremont, California, is the world leader in Spin Transfer Torque Magnetic RAM (STT-MRAM) non-volatile memory leveraging perpendicular magnetic tunnel junction (pMTJ) cell structure manufactured on 300mm standard CMOS process. Backed by more than 300+ granted patents around cell, circuit, and system design leveraging MRAM, our technology and products provide breakthrough speeds,…
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MMIC Design Methodologies

Monolithic microwave integrated circuit, or MMIC is an Integrated Circuit (IC) device that operates at Microwave frequencies (300 MHz to 300 GHz). Perform functions such as High Power Amplifiers (HPA), Low-Noise Amplifiers (LNA) and Single Pole Double Throw (SPDT) Switch. MMICs are dimensionally small (from around 1 mm² to 10 mm²) and can be mass-produced,…
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MIL-PRF-19500

Semiconductor Devices, General Specification for This specification establishes the general performance requirements for Semiconductor devices. Detail requirements and characteristics are specified in the specification sheet. Five quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance (RHA) levels are provided for…
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MIL-STD-883

Test Method Standard, Microcircuits This standard establishes uniform methods, controls, and procedures for Testing Microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures necessary to…
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MIL-STD-750

Test Method Standard Test Methods for Semiconductor Devices This standard establishes uniform methods for Testing Semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term “devices” includes such items as transistors, diodes,…
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MIL-PRF-38535

Integrated Circuits (Microcircuits) Manufacturing, General Specification for This specification establishes the general performance requirements for Integrated Circuits or Microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition. The intent of this specification is to allow the device manufacturer the flexibility to implement best commercial practices to the maximum…
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