MIL Standards & Performance Specification system
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U.S. Defense Military Specifications and Standards as “MIL-STD” and “MIL-PRF” are used to achieve standardization requirements for Quality, Reliability and Cost of Ownership compatibility on stringent applications.
Related documents, such as defense handbooks and defense specifications, are herein addressed.
| SPECIFICATION | DESCRIPTION |
| MIL-STD-202 Test Method Standard, Electronic and Electrical Components |
This standard establishes uniform methods for Testing Electronic and Electrical component parts, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term “component parts” includes such items as Capacitors, Resistors, Switches, Relays, Transformers, and Jacks.
Last version link: ASSIST-QuickSearch |
| MIL-STD-750
Test Method Standard Test Methods for Semiconductor Devices |
This standard establishes uniform methods for Testing Semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices.
Last version link: ASSIST-QuickSearch |
| MIL-STD-883
Test Method Standard, Microcircuits |
This standard establishes uniform methods, controls, and procedures for Testing Microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures necessary to ensure a uniform level of quality and reliability suitable to the intended applications of devices as Monolithic, Multichip, Film and Hybrid Microcircuits, Microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to Microelectronic devices.
Last version link: ASSIST-QuickSearch |
| MIL-PRF-19500
Semiconductor Devices, General Specification for |
This specification establishes the general performance requirements for Semiconductor devices. Detail requirements and characteristics are specified in the specification sheet. Five quality levels for encapsulated devices are provided for in this specification, differentiated by the prefixes JAN, JANTX, JANTXV, and JANS. Eight radiation hardness assurance (RHA) levels are provided for the JANTXV and JANS quality levels. These are designated by the letters M, D, P, L, R, F, G, and H following the quality level portion of the prefix. Two quality levels for unencapsulated devices are provided for in this specification, differentiated by the prefixes JANHC and JANKC.
Last version link: ASSIST-QuickSearch |
| MIL-PRF-38534
Hybrid Microcircuits, General Specification for |
This specification establishes the general performance requirements for Hybrid Microcircuits, Multi-Chip Modules (MCM) and, similar devices and the verification requirements for ensuring that these devices meet the applicable performance requirements. Verification is accomplished through the use of one of two quality programs (Appendix A). The main body of this specification describes the performance requirements and the requirements for obtaining a Qualified Manufacturers List (QML) listing. The appendices of this specification are intended for guidance to aid a manufacturer in developing their verification program. Detail requirements, specific characteristics, and other provisions that are sensitive to the particular intended use should be specified in the applicable device acquisition specification.
Last version link: ASSIST-QuickSearch |
| MIL-PRF-38535
Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
This specification establishes the general performance requirements for Integrated Circuits or Microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition. The intent of this specification is to allow the device manufacturer the flexibility to implement best commercial practices to the maximum extent possible while still providing product that meets military performance needs. The certification and qualification sections found herein outline the requirements to be met by a manufacturer to be listed on a Qualified Manufacturer Listing (QML).
Last version link: ASSIST-QuickSearch |
| MIL-HDBK-103
List of Standard Microcircuit Drawings |
The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, “Parts Management.” The PMP will be the avenue for screening candidate parts for the SMDP by the DLA Land and Maritime Military Parts Control Advisory Group (MPCAG).Last version link: ASSIST-QuickSearch |
Other STANDARDS:
- MIL-STD-1580 – DPA for Electronic, Electromagnetic, and Electromechanical Part
- MIL-STD-1835 – Microcircuit Case Outlines.
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